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  5. JEOL IT 200LV SEM & EDX
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JEOL IT 200LV SEM & EDX

Purpose

Material Characterization Centre

This equipment uses high-energy electrons for high resolution image and elemental analysis.

JEOL scanning electron microscope system with control console and monitor
Electron microscope scan showing bonded wires connected to a semiconductor chip
Close-up of a brake pad showing the textured friction surface and metal backing

Capability

This equipment uses high-energy electrons for high resolution image and elemental analysis.

Specifications

  • Magnifications up to 300,000X

  • Modes of imaging:
    Scattered Electron
    Back Scattered Electron

  • Specimen diameter of up to 150 mm can be accommodated

  • Quantitative elemental detection can be carried out using EDX

Applications

  • Surface morphology analysis of materials science, medical and biological samples

  • Crystallographic orientation analysis of bulk materials

  • Qualitative and quantitative elemental analysis from sodium to uranium

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